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kicad-source/qa/tests/pcbnew
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Seth Hillbrand fcd2da354d Allow wildcard matching for Netclass naming 
Fixes https://gitlab.com/kicad/code/kicad/issues/21455
2025-08-16 13:30:20 -07:00
..
drc
fix for issue 17429 - fixes DRC unconnected items exclusion instability
2025-06-25 17:03:35 +00:00
pcb_io
If we can't load the KiCad, don't crash
2025-06-05 11:40:47 -07:00
CMakeLists.txt
Add QA for COMMMIT/SCH_COMMIT/BOARD_COMMIT
2025-08-08 21:28:54 -07:00
group_saveload.cpp
groups: extract common class methods into EDA_GROUP base class
2025-04-01 14:34:20 -04:00
test_array_pad_name_provider.cpp
PCB array tool: don't count array source pad as reserving its number
2025-04-23 23:32:20 +08:00
test_board_commit.cpp
Add QA for COMMMIT/SCH_COMMIT/BOARD_COMMIT
2025-08-08 21:28:54 -07:00
test_board_item.cpp
make board area colored (from Ethan Chien)
2025-06-19 18:26:39 +02:00
test_component_classes.cpp
Implement dynamic assignment of component classes
2025-03-15 14:33:47 +00:00
test_footprint_load_save.cpp
QA: Use data-driven tests in a few places
2025-01-24 20:13:19 +08:00
test_fp_lib_load_save.cpp
QA: Use data-driven tests in a few places
2025-01-24 20:13:19 +08:00
test_generator_load_save.cpp
QA: Use data-driven tests in a few places
2025-01-24 20:13:19 +08:00
test_graphics_import_mgr.cpp
Revise Copyright statement to align with TLF
2025-01-01 14:12:04 -08:00
test_graphics_load_save.cpp
ADDED: hatched fills for shapes.
2025-02-24 11:08:29 +00:00
test_group_load_save.cpp
QA: Use data-driven tests in a few places
2025-01-24 20:13:19 +08:00
test_io_mgr.cpp
QA: Use data-driven tests in a few places
2025-01-24 20:13:19 +08:00
test_libeval_compiler.cpp
Allow wildcard matching for Netclass naming
2025-08-16 13:30:20 -07:00
test_lset.cpp
Set base user layer count
2025-01-28 12:22:39 -08:00
test_module.cpp
Add a mechanism for using a mock config dir for QA tests
2025-01-18 13:40:38 -05:00
test_multichannel.cpp
Revise Copyright statement to align with TLF
2025-01-01 14:12:04 -08:00
test_pad_numbering.cpp
Revise Copyright statement to align with TLF
2025-01-01 14:12:04 -08:00
test_pcb_grid_helper.cpp
Refactor grid_helper to allow testing
2025-08-05 16:10:17 -07:00
test_pns_basics.cpp
Revise Copyright statement to align with TLF
2025-01-01 14:12:04 -08:00
test_prettifier.cpp
Revise Copyright statement to align with TLF
2025-01-01 14:12:04 -08:00
test_reference_image_load.cpp
QA: Use data-driven tests in a few places
2025-01-24 20:13:19 +08:00
test_save_load.cpp
QA: Use data-driven tests in a few places
2025-01-24 20:13:19 +08:00
test_tracks_cleaner.cpp
Fix other places where "IN" is used instead of INCH (mainly QA tests)
2025-03-02 12:52:16 +01:00
test_triangulation.cpp
QA: Use data-driven tests in a few places
2025-01-24 20:13:19 +08:00
test_zone_filler.cpp
Simplify KiROUND using std::llround/clamp
2025-08-04 09:26:25 -07:00
test_zone.cpp
Revise Copyright statement to align with TLF
2025-01-01 14:12:04 -08:00